MixedWM38 Dataset(WaferMap) has more than 38000 wafer maps, including 1 normal pattern, 8 single defect patterns, and 29 mixed defect patterns, a total of 38 defect patterns.
Source: Deformable Convolutional Networks for Efficient Mixed-Type Wafer Defect Pattern Recognition
Variants: MixedWM38
This dataset is used in 2 benchmarks:
| Task | Model | Paper | Date |
|---|---|---|---|
| Semantic Segmentation | WaferSegClassNet | WaferSegClassNet -- A Light-weight Network … | 2022-07-03 |
| Classification | WaferSegClassNet | WaferSegClassNet -- A Light-weight Network … | 2022-07-03 |
Recent papers with results on this dataset: